\begin{table}[hbt]

\centering

\caption{Sources of systematic errors in the evaluation of the pion contamination. }

\label{Tab:FitSys}

\begin{tabular}{|l|l|p{1.5cm}|p{1.5cm}|}

%\toprule

%\midrule

\hline

Effect                       &  Assessment method                  &  \multicolumn{2}{|p{3cm}|}{Absolute Impact on $\pi$ contamination} \\

\hline

%\hline

%\multicolumn{2}{|r|}{}                                             &  Data   & MC  \\

                             &                                     &  Data   & MC  \\\cline{3-4}

Time-of-flight distribution  &  Finer subdivision                  &  0.18\%   & 0.18\%\\

Time-of-flight calibration   &  Shift calibrations by $\pm$0.1 ns  &  0.04\%   & 0.28\%\\

%Fitted range                 &  vary exclusion region              &  0.14\%  &\\

Histogram binning            &  Double/halve bin sizes             &  0.14\%   & 0.16\%\\

Bias due to contamination in templates & Create pure templates in MC & 0.03\%  & 0.03\% \\

Bias in selection            &  Cut KL cell hits $> 0$               &  0.25\%   & 0.25\% \\ 

\hline 

\multicolumn{2}{|r|}{Total}                                         & 0.34\%    & 0.45\% \\ 

%\bottomrule

\hline

\end{tabular}

\end{table}